IP Library › Granted Patent US 9,312,031
Granted Patent Utility
US 9,312,031 · Confirmation No. 7914

Semiconductor Device and Test Method Thereof

Inventor: Naohisa Nishioka
Applicant: PS4 LUXCO S.A.R.L.
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2015-12-23 892 List of references cited by examiner 1 View
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2015-07-16 A... Amendment/Request for Reconsideration-After Non-Final Rejection 1 View
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Quick Facts
Patent No.
US 9,312,031
App. No.
14/466,989
Filed
2014-08-23
Granted
2016-04-12
Pub. No.
US20140369145A1
Examiner
LE, TOAN K
Art Unit
2825
PTA
-59 days