IP Library Granted Patent US 9,465,075
Granted Patent B2
US 9,465,075 · App. 14/473,799 · Granted Oct 11, 2016

Wetting current diagnostics

Inventors: William E. Edwards (Ann Arbor, MI); Anthony F. Andresen (Chandler, AZ)
Assignee: FREESCALE SEMICONDUCTOR, INC.
G01R31/3277G01R31/006
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Quick Facts
Patent No.
US 9,465,075
App. No.
14/473,799
Granted
Oct 11, 2016
Kind
B2
Abstract

A method of providing wetting current diagnostics for a load control switch includes changing test switch settings of a detection circuit from an operational configuration to a testing configuration. The test switch settings specify respective states of first and second test switches of the detection circuit. The first and second test switches are connected to a node of the detection circuit through which, in the operational configuration, a wetting current for the load control switch flows. The method includes determining whether a voltage at the node becomes no longer indicative of the operational configuration as a result of the changed test switch settings, returning the test switch settings to the operational configuration, and providing a wetting current fault indication if the voltage at the node fails to return to a level indicative of the operational configuration after returning the test switch settings to the operational configuration.

Claims (40)

1. A method of providing wetting current diagnostics for a load control switch, the method comprising:

changing test switch settings of a detection circuit from an operational configuration to a testing configuration, the test switch settings specifying respective states of first and second test switches of the detection circuit, the first and second test switches being connected to a node of the detection circuit through which, in the operational configuration, a wetting current for the load control switch flows;

determining whether a voltage at the node becomes no longer indicative of the operational configuration as a result of the changed test switch settings;

returning the test switch settings to the operational configuration; and

providing a wetting current fault indication if the voltage at the node fails to return to a level indicative of the operational configuration after returning the test switch settings to the operational configuration.

2. The method of claim 1 , wherein the first and second test switches selectively couple the node to either a first reference voltage or a second reference voltage in the operational configuration or the testing configuration, respectively.

3. The method of claim 2 , further comprising providing a fault indication of a short to the first reference voltage if the voltage remains indicative of the operational configuration in response to the changed test switch settings.

4. The method of claim 2 , wherein the node is connected to the first reference voltage via the first test switch in the operational configuration to support the wetting current.

5. The method of claim 4 , wherein the first reference voltage is ground.

6. The method of claim 1 , wherein the respective states of the first and second test switches specified via the test switch settings in the testing configuration are reversed from the respective states specified via the test switch settings in the operational configuration.

7. The method of claim 1 , further comprising, before returning the test switch settings to the operational configuration, and after determining whether the voltage at the node becomes no longer indicative of the operational configuration:

updating the test switch settings of the first and second test switches to a further test configuration in which both of the first and second test switches are open; and

providing a leakage fault indication if the voltage fails to remain not indicative of the operational configuration.

8. The method of claim 1 , wherein a comparator of the detection circuit is used to determine whether the voltage becomes no longer indicative of the operational configuration.

9. The method of claim 8 , wherein the comparator is coupled to the node to determine the state of the load control switch during the operational configuration.

10. A method of providing wetting current diagnostics for a normally open load control switch, the method comprising:

changing test switch settings of a detection circuit from an operational configuration to a testing configuration, the test switch settings specifying respective states of first and second test switches of the detection circuit, the first and second test switches being connected to a node of the detection circuit through which, in the operational configuration, a wetting current for the load control switch flows when the normally open load control switch is closed;

determining, with a comparator of the detection circuit coupled to the node to detect a state of the normally open load control switch in the operational configuration, whether a voltage at the node becomes no longer indicative of the operational configuration as a result of the changed test switch settings;

returning the test switch settings to the operational configuration; and

providing a wetting current fault indication if the comparator determines that the voltage at the node fails to return to a level indicative of the operational configuration after returning the test switch settings to the operational configuration.

11. The method of claim 10 , wherein the first and second test switches selectively couple the node to either a first reference voltage or a second reference voltage in the operational configuration or the testing configuration, respectively.

12. The method of claim 11 , further comprising providing a fault indication of a short to the first reference voltage if the voltage remains indicative of the operational configuration in response to the changed test switch settings.

13. The method of claim 10 , wherein the respective states of the first and second test switches specified via the test switch settings in the testing configuration are reversed from the respective states specified via the test switch settings in the operational configuration.

14. The method of claim 10 , further comprising, before returning the test switch settings to the operational configuration, and after determining whether the voltage at the node becomes no longer indicative of the operational configuration:

updating the test switch settings of the first and second test switches to a further test configuration in which both of the first and second test switches are open; and

providing a leakage fault indication if the voltage fails to remain not indicative of the operational configuration.

15. A switch detection unit for a load control switch, the switch detection unit comprising:

a comparator having an input terminal at a node through which a wetting current flows to reach the load control switch;

first and second test switches connected to the node to selectively couple the node to first and second reference voltages, respectively;

a controller configured to provide control signaling to the first and second switches, the control signaling being configured to change test switch settings from an operational configuration to a testing configuration, and being further configured to return the test switch settings to the operational configuration;

wherein, in the operational configuration, the first test switch is closed and the second test switch is open to support flow of the wetting current through the load control switch when the load control switch is closed;

wherein, in the testing configuration, the first test switch is open and the second test switch is closed.

16. The switch detection unit of claim 15 , wherein the control signaling is further configured to update the test switch settings to a further testing configuration in which both of the first and second test switches are open.

17. The switch detection unit of claim 15 , further comprising circuitry to establish a threshold voltage level at a further input terminal of the comparator.

18. The switch detection unit of claim 15 , further comprising circuitry disposed in series with the first test switch between the first reference voltage and the node and configured to establish a level of the wetting current.

19. The switch detection unit of claim 15 , wherein:

the controller is communicatively coupled to an output of the comparator and configured to provide a short fault indication and a wetting current fault indication;

the controller provides the short fault indication if the comparator determines that a voltage at the node remains indicative of the operational configuration after the control signaling changes the test switch settings to the testing configuration; and

the controller provides the wetting current fault indication if the comparator determines that the voltage at the node fails to return to a level indicative of the operational configuration after the control signaling returns the test switch settings to the operational configuration.

20. The switch detection unit of claim 19 , wherein the controller provides a leakage fault indication if the voltage fails to remain not indicative of the operational configuration after the control signaling updates the test switch settings from the first-named testing configuration to a further testing configuration in which both of the first and second test switches are open.

Assignments (15)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0460 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0502 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0921 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034160/0351 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034160/0370 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034153/0027 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2014
From: EDWARDS, WILLIAM E.; ANDRESEN, ANTHONY F.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 033643/0111 →
Continuity (1)
Related Publication 20160061898A1 · Mar 3, 2016