Phase detector and phase-locked loop
View Patent ↗A phase detector for generating a phase difference signal indicative of a phase difference between a first bi-level signal of frequency F 1 and a second bi-level signal of frequency F 2 is proposed. The phase detector may include first and second detector inputs, first and second flip-flops, a NAND gate, and a first and second overphase detection units. An output of the first overphase detection unit may be connected to a direct input of the second flip-flop and may be arranged to output the level “1” in response to F 1 ≦F 2 and the level “0” in response to F 1 >F 2 . An output of the second overphase detection unit may be connected to a direct input of the first flip-flop and may be arranged to output the level “1” in response to F 2 ≦F 1 and the level “0” in response to F 2 >F 1.
1. A phase detector for generating a phase difference signal indicative of a phase difference between a first bi-level signal of frequency F1 and a second bi-level signal of frequency F2, comprising:
a first detector input for receiving the first bi-level signal;
a second detector input for receiving the second bi-level signal;
a first flip-flop;
a second flip-flop;
a NAND gate;
a first overphase detection unit; and
a second overphase detection unit, wherein:
the first detector input is connected to a clock input of the first flip-flop,
the second detector input is connected to a clock input of the second flip-flop,
a direct output of the first flip-flop is connected to a first input of the NAND gate,
a direct output of the second flip-flop is connected to a second input of the NAND gate,
an output of the NAND gate is connected to an inverse input of the first flip-flop and to an inverse input of the second flip-flop,
an output of the first overphase detection unit is connected to a direct input of the second flip-flop and is arranged to output the level “1” in response to F1≦F2 and the level “0” in response to F1>F2, and
an output of the second overphase detection unit is connected to a direct input of the first flip-flop and is arranged to output the level “1” in response to F2≦F1 and the level “0” in response to F2>F1.
2. The phase detector of claim 1 , wherein the first overphase detection unit comprises a third flip-flop and a first rising edge detector, wherein:
the direct output of the first flip-flop is connected to a direct input of the third flip-flop,
the first detector input is connected to a clock input of the third flip-flop,
the second detector input is connected to an input of the first rising edge detector,
an output of the first rising edge detector is connected to an inverse input of the third flip-flop and is arranged to output a level “0” pulse in response to a rising edge of the second bi-level signal, and
an inverse output of the third flip-flop is connected to the direct input of the second flip-flop, thus acting as said output of the first overphase detection unit.
3. The phase detector of claim 1 , wherein the second overphase detection unit comprises a fourth flip-flop and a second rising edge detector, wherein:
the direct output of the second flip-flop is connected to a direct input of the fourth flip-flop,
the first detector input is connected to an input of the second rising edge detector,
the second detector input is connected to a clock input of the fourth flip-flop,
an output of the second rising edge detector connected to an inverse input of the fourth flip-flop and is arranged to output a level “0” pulse in response to a rising edge of the first bi-level signal, and
an inverse output of the fourth flip-flop is connected to the direct input of the first flip-flop, thus acting as said output of the second overphase detection unit.
4. The phase detector of claim 1 , wherein the first overphase detection unit comprises a third flip-flop, a second NAND gate, a third NAND gate, and a fourth NAND gate, and wherein
the first detector input is connected to a first input of the second NAND gate,
the second detector input is connected to a first input of the third NAND gate,
the direct output of the first flip-flop is connected to an inverse input of the third flip-flop,
a direct output of the third flip-flop is connected to a second input of the third NAND gate,
an output of the second NAND gate is connected to a first input of the fourth NAND gate,
an output of the third NAND gate is connected to a second input of the fourth NAND gate,
an output of the fourth NAND gate is connected to a clock input of the third flip-flop, and
an inverse output of the third flip-flop is connected to a direct input of the third flip-flop, to a second input of the second NAND gate, and to the direct input of the second flip-flop, thus acting as said output of the first overphase detection unit.
5. The phase detector of claim 1 , wherein the second overphase detection unit comprises a fourth flip-flop, a fifth NAND gate, a sixth NAND gate, and a seventh NAND gate, and wherein:
the first detector input is connected to a first input of the sixth NAND gate,
the second detector input is connected to a first input of the fifth NAND gate,
the direct output of the second flip-flop is connected to an inverse input of the fourth flip-flop,
a direct output of the fourth flip-flop is connected to a second input of the sixth NAND gate,
an output of the fifth NAND gate is connected to a first input of the seventh NAND gate,
an output of the sixth NAND gate is connected to a second input of the seventh NAND gate,
an output of the seventh NAND gate is connected to a clock input of the fourth flip-flop,
an inverse output of the fourth flip-flop is connected to a direct input of the fourth flip-flop, to a second input of the fifth NAND gate, and to the direct input of the first flip-flop, thus acting as said output of the second overphase detection unit.
6. The phase detector of claim 1 , wherein a time average of a difference of the output voltage at the direct output of the first flip-flop and the output voltage at the direct output of the second flip-flop is indicative of said phase difference.
7. A phase-locked loop comprising an oscillator; a frequency divider; and a phase detector, wherein the phase detector generates a phase different signal indicative of a phase difference between a first bi-level signal of frequency F1 and a second bi-level signal of frequency F2 and includes a first detector input for receiving the first bi-level signal, a second detector input for receiving the second bi-level signal, a first flip-flop, a second flip-flop, a NAND gate, a first overphase detection unit, a second overphase detection unit, wherein:
the first detector input is connected to a clock input of the first flip-flop,
the second detector input is connected to a clock input of the second flip-flop,
a direct output of the first flip-flop is connected to a first input of the NAND gate,
a direct output of the second flip-flop is connected to a second input of the NAND gate,
an output of the NAND gate is connected to an inverse input of the first flip-flop and to an inverse input of the second flip-flop,
an output of the first overphase detection unit is connected to a direct input of the second flip-flop and is arranged to output the level “1” in response to F1≦F2 and the level “0” in response to F1>F2,
an output of the second overphase detection unit is connected to a direct input of the first flip-flop and is arranged to output the level “1” in response to F2≦F1 and the level “0” in response to F2>F1,
an output of the oscillator is connected to the frequency divider, an output of the frequency divider is connected to the second detector input, a reference signal is applicable at the first detector input, and an input of the oscillator is connected to the phase detector so that an oscillation frequency of the oscillator is responsive to a time-average of the voltage at the direct output of the first flip-flop minus the voltage at the direct output of the second flip-flop.