Semiconductor device having plural memory chip
A semiconductor device includes a stacked plurality of memory chips. The memory chips each include a plurality of memory banks, a plurality of read/write buses that are assigned to the respective memory banks, and a plurality of penetration electrodes that are assigned to the respective read/write buses and arranged through the memory chip. Penetration electrodes arranged in the same positions as seen in a stacking direction are connected in common between the chips. In response to an access request, the memory chips activate the memory banks that are arranged in respective different positions as seen in the stacking direction, whereby data is simultaneously input/output via the penetration electrodes that lie in different planar positions.
1. A method for operating a semiconductor device comprising a plurality of vertically stacked memory chips each having a plurality of memory banks, a plurality of data buses for transferring data to/from an associated one of the memory banks, and a plurality of through silicon via (TSV) penetration electrodes penetrating through the memory chip for transferring data to/from at least one adjacent vertically stacked memory chip in the vertical direction over an associated one of the data buses, the method comprising:
each of the plurality of stacked memory chips activating a selected memory bank in the respective stacked memory chip; and
the plurality of stacked memory chips simultaneously transferring data from each of the selected memory banks, wherein the data is transferred through corresponding TSV penetration electrodes in parallel.
2. The method as claimed in claim 1 wherein the memory banks are activated in response to a common command signal.
3. The method as claimed in claim 1 wherein the memory banks are selected in response to a common address signal.
4. The method as claimed in claim 3 wherein the memory banks are selected in response to a chip address unique to each of the memory chips.
5. The method as claimed in claim 4 wherein the memory banks are selected in response an exclusive OR of the chip address and the common address signal.
6. The method as claimed in claim 1 wherein each of the plurality of stacked memory chips is connected to each of the plurality of data buses and transfers data through a selected one of the plurality of data buses at one time.
7. The method as claimed in claim 1 wherein the number of banks and the number of data buses are equal.
8. The method as claimed in claim 1 wherein the TSV penetration electrodes corresponding to each data bus are grouped and laid out in different planar positions on the memory chips.
9. The method as claimed in claim 1 wherein the TSV penetration electrodes corresponding to each data bus are grouped and laid out adjacent to corresponding memory banks on the memory chips.