SRAM with first and second precharge circuits
A semiconductor storage device includes an SRAM memory cell composed of a drive transistor, a transfer transistor and a load transistor, an I/O circuit that is connected to bit lines connected to the memory cell, and an operating mode control circuit that switches an operating mode of the I/O circuit between a resume standby mode and a normal operation mode, wherein the I/O circuit includes a write driver that writes data to bit lines, a sense amplifier that reads data from the bit lines, a first switch inserted between the bit lines and the write driver, a second switch inserted between the bit lines and the sense amplifier, a precharge circuit that precharges the bit lines, and a control circuit that controls the first and second switches and the precharge circuit according to a signal from the operating mode control circuit.
1. A static random access memory circuit in a semiconductor device comprising:
a power supply line;
a plurality of word lines;
a pair of bit lines;
a plurality of memory cells coupled to the plurality of word lines and the pair of bit lines such that each memory cell is coupled to one word line and the pair of bit lines;
a first circuit comprising:
a first PMOS transistor having a source-drain path coupled between the power supply line and one of the pair of bit lines, and
a second PMOS transistor having a source-drain path coupled between the power supply line and the other of the pair of bit lines; and
a second circuit comprising:
a third PMOS transistor having a source-drain path coupled between the power supply line and one of the pair of bit lines, and
a fourth PMOS transistor having a source-drain path coupled between the power supply line and the other of the pair of bit lines,
wherein the first PMOS transistor and the second PMOS transistor have their gates coupled to receive a first control signal,
wherein the third PMOS transistor and the fourth PMOS transistor have their gates coupled to receive a second control signal different from the first control signal,
wherein the static random access memory circuit has a resume standby mode and a normal operation mode,
wherein, when the static random access memory circuit is in the resume standby mode, the first PMOS transistor, the second PMOS transistor, the third PMOS transistor and the fourth PMOS transistor are turned off by the first control signal and the second control signal, respectively, and
wherein, when the static random access memory circuit is changed from the resume standby mode to the normal operation mode:
(1) the third PMOS transistor and the fourth PMOS transistor are turned on by the second control signal while the first PMOS transistor and the second PMOS transistor are turned off by the first control signal, and
(2) subsequently, the first PMOS transistor and the second PMOS transistor are turned on by the first control signal, and the third PMOS transistor and the fourth PMOS transistor are turned off by the second control signal.
2. A static random access memory circuit according to claim 1 ,
wherein the first circuit further comprises a fifth PMOS transistor having:
a source-drain path coupled between the pair of bit lines, and
a gate coupled to receive the first control signal.
3. A static random access memory circuit according to claim 1 ,
wherein a drivability of the second circuit is smaller than that of the first circuit.