Intracycle bitline restore in high performance memory

1. A structure comprising at least one bit line restore device which is configured to precharge a bit line to a specified voltage during an intracycle time between a read operation and a write operation and is configured to be turned off during the read operation and the write operation,

wherein the at least one bit line restore device comprises a first transistor and a second transistor,

the first transistor is gated by a read bit switch signal and is between a power supply signal and a drain of the second transistor, and

the second transistor is gated by a write bit switch signal and is between the first transistor and a drain of a third transistor.

2. The structure of claim 1 , wherein the first transistor and the third transistor are NMOS transistors and the second transistor is a PMOS transistor.

3. The structure of claim 1 , wherein the specified voltage is a difference between a voltage value of the power supply signal and a threshold voltage of the first transistor.

4. The structure of claim 1 , further comprising a true and complement write driver which drives the bit line to the specified voltage.

5. The structure of claim 4 , wherein the true and complement write driver drives the bit line to the specified voltage based on a PMOS transistor.

6. The structure of claim 4 , wherein the true and complement write driver pulls another bit line to ground.

7. The structure of claim 6 , wherein the another bit line is a complement signal with respect to the bit line.

8. The structure of claim 1 , wherein the first transistor includes a drain directly connected to the power supply signal and a source directly connected to a source of the second transistor which includes the drain directly connected to the drain of the third transistor which is gated by the write bit switch signal and includes a source directly connected to a digit line complement write signal.

9. The structure of claim 8 , wherein the drain of the third transistor is directly connected to a source of a fourth transistor which is gated by the read bit switch signal and has a drain directly connected to a digit line complement signal.

10. A method, comprising:

turning off a bit line restore device during a read operation;

precharging a bit line to a voltage difference between a voltage value of a power supply signal and a threshold voltage of a transistor in the bit line restore device; and

turning off the bit line restore device during a write operation,

wherein the bit line restore device comprises a first transistor and a second transistor,

the first transistor is gated by a read bit switch signal and is between a power supply signal and a drain of the second transistor, and

the second transistor is gated by a write bit switch signal and is between the first transistor and a drain of a third transistor.

11. The method of claim 10 , wherein the precharging of the bit line occurs in an intracycle time between the read operation and the write operation using a true and complement write driver.

12. The method of claim 10 , wherein the first transistor includes a drain directly connected to the power supply signal and a source directly connected to a source of the second transistor which includes the drain directly connected to the drain of the third transistor which is gated by the write bit switch signal and includes a source directly connected to a digit line complement write signal.

13. The method of claim 12 , wherein the drain of the third transistor is directly connected to a source of a fourth transistor which is gated by the read bit switch signal and has a drain directly connected to a digit line complement signal.