IP Library Granted Patent US 11,264,311
Granted Patent B2
US 11,264,311 · App. 16/677,103 · Granted Mar 1, 2022

Clips for semiconductor package and related methods

Inventors: Inpil Yoo (Unterhaching, DE); Seungwon Im (Seoul, KR); JooYang Eom (Gimpo-si, KR); Jerome Teysseyre (Scottsdale, AZ)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01L23/49568H01L23/49524H01L23/49562H01L24/29H01L24/32H01L24/37H01L24/49H01L24/73H01L24/83H01L2224/291H01L2224/37147H01L2224/37599H01L2224/73265H01L2224/8385H01L2924/01029H01L2924/10272H01L2924/15787
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Quick Facts
Patent No.
US 11,264,311
App. No.
16/677,103
Granted
Mar 1, 2022
Kind
B2
Abstract

Implementations of a clip may include a first copper layer directly bonded to a first side of a ceramic layer, a second copper layer directly bonded to a second side of the ceramic layer, the second side of the ceramic layer opposite the first side of the ceramic layer, and a plurality of channels partially etched into a thickness of the second copper layer.

Claims (31)

1. A clip comprising:

a first copper layer directly bonded to a first side of a ceramic layer;

a second copper layer directly bonded to a second side of the ceramic layer, the second side of the ceramic layer opposite the first side of the ceramic layer; and

a plurality of channels partially etched into a thickness of the second copper layer.

2. The clip of claim 1 , wherein the clip is a direct bond copper (DBC) clip.

3. The clip of claim 1 , further comprising one or more fully etched channels through the thickness of the second copper layer.

4. The clip of claim 1 , wherein the plurality of channels are half etched, and are etched into the second copper layer from a first surface of the second copper layer opposite a second surface of the second copper layer directly bonded to the ceramic layer.

5. The clip of claim 1 , wherein the clip is configured to be placed over a plurality of semiconductor die; and

wherein a width of the plurality of channels is configured to be substantially the same as a width of one or more spaces between the plurality of semiconductor die.

6. The clip of claim 1 , wherein the plurality of channels are configured to dissipate heat from a plurality of semiconductor die.

7. The clip of claim 1 , wherein a perimeter of the clip is configured to be smaller than a substrate to which the clip is coupled.

8. A semiconductor package comprising:

a substrate coupled to a first side of one or more semiconductor die; and

a first direct bond copper (DBC) clip coupled to a second side of the one or more semiconductor die, the first DBC clip comprising a copper layer directly bonded to the one or more semiconductor die;

wherein the first DBC clip comprises a plurality of channels partially etched into the copper layer.

9. The semiconductor package of claim 8 , further comprising one or more channels fully etched into the copper layer.

10. The semiconductor package of claim 8 , wherein the plurality of channels are directly over one or more spaces between the one or more semiconductor die.

11. The semiconductor package of claim 8 , wherein the first DBC clip is directly coupled to the second side of the one or more semiconductor die.

12. The semiconductor package of claim 8 , further comprising at least a second DBC clip coupled to the one or more semiconductor die.

13. The semiconductor package of claim 8 , wherein the one or more semiconductor die are configured to be cooled on both the first side and the second side.

14. The semiconductor package of claim 8 , wherein the plurality of channels correspond in width and location to one or more spaces between the one or more semiconductor die.

15. A semiconductor package comprising:

a direct bond copper (DBC) substrate coupled to a first side of one or more semiconductor die; and

a first clip coupled to a second side of one or more semiconductor die, the first clip comprising a copper layer directly bonded to the one or more semiconductor die;

wherein the first clip comprises a plurality of heat dissipation channels half etched into the copper layer; and

wherein the plurality of heat dissipation channels are directly over one or more spaces between the one or more semiconductor die.

16. The semiconductor package of claim 15 , wherein the one or more semiconductor die comprise silicon carbide (SiC).

17. The semiconductor package of claim 15 , wherein a sidewall of the plurality of heat dissipation channels is aligned with a sidewall of a semiconductor die of the one or more semiconductor die.

18. The semiconductor package of claim 15 , further comprising a second clip and a third clip.

19. The semiconductor package of claim 15 , wherein the one or more semiconductor die are cooled on both the first side of the one or more semiconductor die and the second side of the one or more semiconductor die.

20. The semiconductor package of claim 18 , wherein a perimeter of the first clip, a perimeter of the second clip, and a perimeter of the third clip each are within a perimeter of the DBC substrate.

Assignments (4)
SECURITY INTEREST Recorded Jul 13, 2023
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; GTAT CORPORATION
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064271/0971 →
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 054090, FRAME 0617 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064081/0167 →
SECURITY INTEREST Recorded Oct 16, 2020
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION; ON SEMICONDUCTOR CONNECTIVITY SOLUTIONS, INC.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 054090/0617 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2019
From: YOO, INPIL; IM, SEUNGWON; EOM, JOOYANG; TEYSSEYRE, JEROME
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 050950/0427 →
Continuity (2)
Provisional Application 62913894 · Oct 11, 2019
Related Publication 20210111104A1 · Apr 15, 2021