Patent Assignment
Reel/Frame 007878/0296
Assignment of Assignor's Interest
Recorded: 1996-04-05
Pages: 3
Assignor
OOISHI, TSUKASA
Executed: 1995-12-06
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100, JAPAN
Covered Property
(1)
Semiconductor Memory Device Capable of High Speed Plural Parallel Test, Method of Data Writing Therefor and Parallel Tester
Patent:
5,717,652 →
Application:
08/589,358 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.