Patent Assignment
Reel/Frame 009191/0195
Assignment of Assignor's Interest
Recorded: 1998-05-26
Pages: 3
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, PALDAL-KU, SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Monitoring Defects of Semiconductor Device
Patent:
6,038,019 →
Application:
09/084,229 →
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.