Assignment of Assignor's Interest

Recorded: 1999-08-27 Pages: 3

Assignor

ASOU, MASAO

Executed: 1999-08-19

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Method of and Apparatus for Designing Test Facile Semiconductor Integrated Circuit

Patent: 6,415,404 →

Application: 09/384,950 →

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.