Assignment of Assignor's Interest

Recorded: 2000-04-19 Pages: 2

Assignor

MATSUURA, SEIJI

Executed: 2000-04-07

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Method of measuring spherical aberration in projection system

Patent: 6,310,684 →

Application: 09/552,306 →

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.