Patent Assignment
Reel/Frame 011093/0566
Assignment of Assignor's Interest
Recorded: 2000-09-18
Pages: 3
Assignors
GOTO, HIROYUKI
Executed: 2000-07-17
SAITO, HIROYUKI
Executed: 2000-07-17
FUJINAMI, MAKIKO
Executed: 2000-07-31
SHIRAI, HIROSHI
Executed: 2000-07-13
Assignee
TOSHIBA CERAMICS CO., LTD.
7-5-25 NISHI-SHINJUKU, SHINJUKU-KU, TOKYO, JAPAN
Covered Property
(1)
Wafer Defect Measuring Method and Apparatus
Patent:
6,734,960 →
Application:
09/589,087 →
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger
Sep 13, 2007
From: TOSHIBA CERAMICS CO., LTD.
To: COVALENT MATERIALS CORPORATION
Reel/Frame 019817/0749 →
Assignment of Assignor's Interest
Mar 11, 2013
From: COVALENT MATERIALS CORPORATION
To: COVALENT SILICON CORPORATION
Reel/Frame 029962/0497 →
Change of Name
Mar 13, 2013
From: COVALENT SILICON CORPORATION
To: GLOBALWAFERS JAPAN CO., LTD.
Reel/Frame 029991/0421 →