IP Library › Assignment 011383/0326
Patent Assignment
Reel/Frame 011383/0326

Assignment of Assignor's Interest

Recorded: 2000-12-19 Pages: 3
Assignors
MARUYAMA, SHIGEYUKI
Executed: 2000-12-01
MATSUKI, HIROHISA
Executed: 2000-12-01
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAW, 211-8588, JAPAN
Covered Property (1)
Semiconductor Device Testing Contactor Having a Circuit-Side Contact Piece and Test-Board-Side Contact Piece
Patent: 6,939,142 →
Application: 09/739,288 →
Publication: US 2001/0024890
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Re-Record to Correct the Assignee's Address, Previously Recorded on Reel 011383 Frame 0326, Assignor Confirms the Assignment of the Entire Interest. Mar 4, 2001
From: MARUYAMA, SHIGEYUKI; MATSUKI, HIROHISA
To: FUJITSU LIMITED
Reel/Frame 011765/0544 →
Assignment of Assignor's Interest Dec 5, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0876 →
Change of Name Aug 2, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024804/0269 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0612 →