Patent Assignment
Reel/Frame 035507/0612
Assignment of Assignor's Interest
Recorded: 2015-04-27
Pages: 67
Assignor
FUJITSU SEMICONDUCTOR LIMITED
Executed: 2015-03-02
Assignee
SOCIONEXT INC.
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Properties
(89)
Non-Voltile Memory Device, Non-Volatile Memory Cell and Method of Adjusting the Threshold Value of the Non-Volatile Memory Cell and Each of Plural Transistors
Patent:
5,748,530 →
Application:
08/381,944 →
Electrically-Erasable Rom with Pulse-Driven Memory Cell Transistors
Patent:
5,623,444 →
Application:
08/516,830 →
Electrically-Erasable and Programmable Rom with Pulse-Driven Memory Cell
Patent:
5,818,753 →
Application:
08/692,861 →
Electrically-Erasable Rom with Pulse-Driven Memory Cells
Patent:
5,812,458 →
Application:
08/692,862 →
Non-Volatile Memory with Floating Gate Type Cell Transistors and Method for Adjusting Threshold Valves of These Transistors
Patent:
5,729,494 →
Application:
08/716,527 →
Nonvolatile Memory Device with Verify Function
Patent:
5,886,927 →
Application:
09/011,450 →
Timestamp-Based Timing Recovery for Cable Modem Media Access Controller
Patent:
6,698,022 →
Application:
09/461,911 →
Reducing jitter in mixed-signal circuitry
Patent:
6,344,816 →
Application:
09/666,164 →
Testing System
Patent:
6,798,831 →
Application:
09/709,317 →
An Electronically Rewritable Non-Volatile Semiconductor Memory Device
Patent:
6,535,420 →
Application:
09/717,296 →
Apparatus for analyzing failure for semiconductor memory device
Operational Amplifier and Its Offset Cancel Circuit
Semiconductor Device Testing Contactor Having a Circuit-Side Contact Piece and Test-Board-Side Contact Piece
Contactor Having Conductive Particles in a Hole as a Contact Electrode
Semiconductor Device and Semiconductor Device Testing Method
Operational Amplifier Circuit
-- Power on Reset Circuit/Method for Initializing an Integrated Circuit ---
Charge Coupled Device for Outputting Image Data
Internal Voltage Generation Circuit
Ieee-1394 Standardized Apparatus and Configuration Method Therein
Image Sensor with Stabilized Black Level and Low Power Consumption
Method of Designing a Layout of an Lsi Chip, and a Computer Product
Synchronization Establishing Device, Method of Establishing Synchronization, and Receiver
Semiconductor Memory Device Allowing Static-Charge Tolerance Test Between Bit Lines
Semiconductor Storage Device Conducting a Late-Write Operation and Controlling a Test Read-Operation to Read Data Not from a Data Latch Circuit but from a Memory Core Circuit Regardless of Whether a Preceding Address and a Present Address Match Each Other
Microcontroller with Improved Access Efficiency Og Instructions
Semiconductor Memory Device
Semiconductor Memory Device
Semiconductor Memory Device
Digital Signal Detector, Digital Demodulator, Method for Detecting Digital Signal, and Method for Synchronous Detecting by Digital Demodulator
Differential Amplifier Having Improved Balance and Linearity
Apparatus for Changing Pulse Width Modulation at Desired Timing
An Input Signal Receiving Ciruit for Semiconductor Integrated Circuit
Semiconductor Integrated Circuit
Semiconductor Memory Device
Synchronizing Pattern Position Detection Circuit
Oversampling Fir Filter, Method for Controlling the Same, Semiconductor Integrated Circuit Having the Same, and Communication System for Transmitting Data Filtered by the Same
Resetting Circuit Independent of a Transistor's Threshold
Input/Output Interfacing Circuit, Input/Output Interface, and Semiconductor Device Having Input/Output Interfacing Circuit
Semiconductor Integrated Circuit Having Circuit for Changing Timing of Inactivating Power-on Resetting Circuit
Semiconductor Integrated Circuit and Method for Controlling Activation Thereof
Memory System and Memory Controller with Reliable Data Latch Operation
Semiconductor Device with Output Latch Circuit Outputting Complementary Data at High Speed
Semiconductor Device and Method for Fabricating the Same
Semiconductor Memory Device with Reduced Current Consumption
Semiconductor Memory, and Memory Access Method
Semiconductor Memory and Method of Operating Same
Semiconductor Substrate Test Device and Method
Demodulation Apparatus, Broadcasting System and Broadcast Receiving Apparatus
Semiconductor Memory Device with Concurrent Refresh and Data Access Operation
Low Power Circuit with Proper Slew Rate by Automatic Adjustment of Bias Current
Clock Synchronized Dynamic Memory and Clock Synchronized Integrated Circuit
Semiconductor Memory Device Having a Second Voltage Supplier Supplying Transfer Gates with a Second Voltage Higher Than a First Voltage
Semiconductor Memory
Fir Filter,Method of Operating the Same, Semiconductor Integrated Circuit Including Fir Filter, and Communication System for Transmitting Data Filtered by Fir Filter
Semiconductor Device Making Reliable Initial Setting
Semiconductor Device Having Memory with Effective Precharging Scheme
Semiconductor Memory Device
Semiconductor Memory Device Having Sram Interface
Delay Characteristic Analyzing Method and Delay Characteristic Analyzing System for a Custom Lsi
Semiconductor Device Having Dummy Pattern
Semiconductor Memory and Method of Operating the Same
Segmented Circuitry
Semiconductor Memory and Method of Operating the Same
Multiplexer with Dummy Switches in Normally Off State to Increase Operating Speed
Precharge Circuit with Small Width
Reducing Jitter in Mixed-Signal Integrated Circuit Devices
Semiconductor Integrated Circuit with Dummy Patterns
Semiconductor Memory Device
Ic Chip
Semiconductor Integrated Circuit Including Clock Modulation Circuit
Method for Layout Design and Timing Adjustment of Logically Designed Integrated Circuit
Semiconductor Device
Semiconductor Integrated Circuit
Apparatus for Analyzing Failure for Semiconductor Memory Device
Semiconductor Memory Device for Masking All Bits in a Test Write Operation
Input/Output Interfacing Circuit, Input/Output Interface, and Semiconductor Device Having Input/Out Interfacing Circuit
Input/Output Interfacing Circuit, Input/Output Interface, and Semiconductor Device Having Input/Out Interfacing Circuit
Semiconductor Storage Device Conducting a Late-Write Operation and Controlling a Test Read-Operation to Read Data Not from a Data Latch Circuit but from a Memory Core Circuit Regardless of Whether a Preceding Address and a Present Address Match Each Other
Semiconductor Memory Device
Substrate Voltage Selection Circuit
Electronically Rewritable Non-Volatile Semiconductor Memory Device
Contactor Having Conductive Particles in a Hole as a Contact Electrode
Reducing Jitter in Mixed-Signal Integrated Circuit Devices
Semiconductor Integrated Circuit
Semiconductor Integrated Circuit with Dummy Patterns
Contactor Having Conductive Particles in a Hole as a Contact Electrode
Method of Manufacturing a Semiconductor Device Testing Contactor Having a Circuit-Side Contact Piece and Test-Board-Side Contact Piece
Contactor Having Conductive Particles in a Hole as a Contact Electrode