IP Library › Granted Patent US 6,654,938
Granted Patent Utility
US 6,654,938 · Confirmation No. 7336

DELAY CHARACTERISTIC ANALYZING METHOD AND DELAY CHARACTERISTIC ANALYZING SYSTEM FOR A CUSTOM LSI

Inventor: Kazuyuki Kosugi
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 Code Description Pages PDF
2003-09-03 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-09-03 LET. Miscellaneous Incoming Letter 2 View
2001-09-10 TRNA Transmittal of New Application 2 View
2001-09-10 SPEC Specification 48 View
2001-09-10 CLM Claims 12 View
2001-09-10 ABST Abstract 1 View
2001-09-10 DRW Drawings-only black and white line drawings 25 View
2001-09-10 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,654,938
App. No.
09/949,088
Filed
2001-09-10
Granted
2003-11-25
Pub. No.
US20020100006A1
Examiner
LIN, SUN J
Art Unit
2825
PTA
-84 days