IP Library Granted Patent US 7,023,080
Granted Patent B2
US 7,023,080 · App. 10/896,048 · Granted Apr 4, 2006

Semiconductor integrated circuit with dummy patterns

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,023,080
App. No.
10/896,048
Granted
Apr 4, 2006
Kind
B2
Abstract

A semiconductor integrated circuit includes a plurality of layers provided on a semiconductor substrate, wires provided in a first layer that is one of the plurality of layers, and wire dummies provided in a second layer different from the first layer and having an arrangement that avoids areas overlapping positions of the wires.

Claims (12)

1. A semiconductor integrated circuit, comprising:

a plurality of layers provided on a semiconductor substrate;

signal wires provided in a first layer that is one of said plurality of layers;

a power supply wire provided in the first layer or another layer that is one of said plurality of layers; and

wire dummies provided in a second layer different from the first layer and said another layer by avoiding areas that are directly above or below positions of said signal wires provided in said first layer, at least some of said wire dummies being positioned in areas that are directly above or below positions of said power supply wire.

2. The semiconductor integrated circuit as claimed in claim 1 , wherein the first layer is a layer immediately above or immediately below the second layer.

3. A semiconductor integrated circuit, comprising:

a plurality of layers provided on a semiconductor substrate;

wires provided in a first layer that is one of said plurality of layers;

polysilicon wires;

diffusion regions; and

wire dummies provided in a second layer different from the first layer by avoiding areas that are directly above or below positions of said wires provided in said first layer, wherein said wire dummies further avoid areas that are directly above positions of polysilicon wires or diffusion regions.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0612 →
CHANGE OF NAME Recorded Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →