Granted Patent
Utility
US 6,410,354
· Confirmation No. 6703
SEMICONDUCTOR SUBSTRATE TEST DEVICE AND METHOD
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-07-18 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-07-18 | SPEC |
Specification | 26 | View | |
| 2001-07-18 | CLM |
Claims | 7 | View | |
| 2001-07-18 | ABST |
Abstract | 1 | View | |
| 2001-07-18 | DRW |
Drawings-only black and white line drawings | 10 | View | |
| 2001-07-18 | OATH |
Oath or Declaration filed | 5 | View |
Inventors
Shigeyuki Maruyama
Kawasaki, JAPAN
Naoyuki Watanabe
Kawasaki, JAPAN
Daisuke Koizumi
Kawasaki, JAPAN
Akira Sawamori
Kasugai, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/14
H10P74/00
G01R31/2891
G01R1/07314
Prosecution
- Examiner
- THOMPSON, CRAIG
- Art Unit
- 2813
- Customer No.
- 23850
- Docket No.
- 010914
- Confirmation No.
- 6703
Foreign Priority
2000-232304
·
2000-07-31
·
JAPAN
Publication
- Pub. No.
- US20020031849A1
- Pub. Date
- 2002-03-14
Patent Term Adjustment
0days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2015-04-27
CHANGE OF NAME
Recorded 2010-08-02
from
FUJITSU LIMITED
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2008-12-05
CORRECTIVE DOCUMENT FOR THIRD INVENTOR'S LAST NAME
Recorded 2001-11-02
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-07-18
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Quick Facts
- Patent No.
- US 6,410,354
- App. No.
- 09/906,675
- Filed
- 2001-07-18
- Granted
- 2002-06-25
- Pub. No.
- US20020031849A1
- Examiner
- THOMPSON, CRAIG
- Art Unit
- 2813
- PTA
- 0 days
External Links