IP Library › Assignment 012297/0009
Patent Assignment
Reel/Frame 012297/0009

Corrective Document for Third Inventor's Last Name

Recorded: 2001-11-02 Pages: 5
Assignors
MARUYAMA, SHIGEYUKI
Executed: 2001-07-02
WATANABE, NAOYUKI
Executed: 2001-07-02
KOIZUMI, DAISUKE
Executed: 2001-07-02
SAWAMORI, AKIRA
Executed: 2001-07-02
Assignee
FUJITSU LIMITED
NAKAHARA-KU, 1-1 KAMIKODANAKA 4-CHOME, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Semiconductor Substrate Test Device and Method
Patent: 6,410,354 →
Application: 09/906,675 →
Publication: US 2002/0031849
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 18, 2001
From: MARUYAMA, SHIGEYUKI; WATANABE, NAOYUKI; KOIZUME, DAISUKE; SAWAMORI, AKIRA
To: FUJITSU LIMITED
Reel/Frame 012000/0334 →
Assignment of Assignor's Interest Dec 5, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0876 →
Change of Name Aug 2, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024804/0269 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0612 →