IP Library › Assignment 012000/0334
Patent Assignment
Reel/Frame 012000/0334

Assignment of Assignor's Interest

Recorded: 2001-07-18 Pages: 3
Assignors
MARUYAMA, SHIGEYUKI
Executed: 2001-07-02
WATANABE, NAOYUKI
Executed: 2001-07-02
KOIZUME, DAISUKE
Executed: 2001-07-02
SAWAMORI, AKIRA
Executed: 2001-07-02
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Semiconductor Substrate Test Device and Method
Patent: 6,410,354 →
Application: 09/906,675 →
Publication: US 2002/0031849
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Document for Third Inventor's Last Name Nov 2, 2001
From: MARUYAMA, SHIGEYUKI; WATANABE, NAOYUKI; KOIZUMI, DAISUKE; SAWAMORI, AKIRA
To: FUJITSU LIMITED
Reel/Frame 012297/0009 →
Assignment of Assignor's Interest Dec 5, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0876 →
Change of Name Aug 2, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024804/0269 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0612 →