IP Library › Assignment 011766/0488
Patent Assignment
Reel/Frame 011766/0488

Assignment of Assignor's Interest

Recorded: 2001-05-01 Pages: 2
Assignors
HARAGUCHI, MASARU
Executed: 2001-04-19
DOSAKA, KATSUMI
Executed: 2001-04-19
TANIZAKI, TETSUSHI
Executed: 2001-04-19
Assignee
MITSUBISHI DENKI KABUSHIKA KAISHA
CHIYODA-KU, 2-3, MARUNOUCHI 2-CHOME, TOKYO 100-8310, JAPAN
Covered Property (1)
Circuit for Reducing Test Time and Semiconductor Memory Device Including the Circuit
Patent: 6,779,139 →
Application: 09/845,494 →
Publication: US 2002/0056061
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →
Change of Name Sep 10, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0001 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →