IP Library Granted Patent US 6,779,139
Granted Patent Utility
US 6,779,139 · Confirmation No. 2365

CIRCUIT FOR REDUCING TEST TIME AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE CIRCUIT

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Code Description Pages PDF
2004-06-29 IFEE Issue Fee Payment (PTO-85B) 1 View
2001-05-01 TRNA Transmittal of New Application 2 View
2001-05-01 SPEC Specification 28 View
2001-05-01 CLM Claims 5 View
2001-05-01 ABST Abstract 1 View
2001-05-01 DRW Drawings-only black and white line drawings 25 View
2001-05-01 OATH Oath or Declaration filed 4 View
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Quick Facts
Patent No.
US 6,779,139
App. No.
09/845,494
Filed
2001-05-01
Granted
2004-08-17
Pub. No.
US20020056061A1
Art Unit
2133
PTA
0 days