Patent Assignment
Reel/Frame 012092/0933
Assignment of Assignor's Interest
Recorded: 2001-05-30
Pages: 3
Assignors
YANASE, YOSHIO
Executed: 2001-04-11
NAKAMURA, OSAMU
Executed: 2001-04-13
KOIKE, TAKASHI
Executed: 2001-04-23
KUDO, NOBORU
Executed: 2001-04-23
Assignee
SUMITOMO METAL INDUSTRIES, LTD.
5-33, KITAHAMA 4-CHOME, CHUO-KU, OSAKA-SHI, OSAKA 541-0041, JAPAN
Covered Property
(1)
Method for Inspecting Surface of Semiconductor Wafer
Patent:
6,726,319 →
Application:
09/856,982 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 5, 2002
From: SUMITOMO METAL INDUSTRIES, LTD.
To: SUMITOMO MITSUBISHI SILICON CORPORATION
Reel/Frame 013060/0349 →
Assignment of Assignor's Interest
Feb 18, 2004
From: SUMITOMO METAL INDUSTRIES, LTD.
To: SUMITOMO MITSUBISHI SILICON CORPORATION
Reel/Frame 014988/0545 →