Patent Assignment
Reel/Frame 014988/0545
Assignment of Assignor's Interest
Recorded: 2004-02-18
Pages: 3
Assignor
SUMITOMO METAL INDUSTRIES, LTD.
Executed: 2002-06-19
Assignee
SUMITOMO MITSUBISHI SILICON CORPORATION
1-2-1, SHIBAURA, MINATO-KU, TOKYO 105-8634, JAPAN
Covered Property
(1)
Method for Inspecting Surface of Semiconductor Wafer
Patent:
6,726,319 →
Application:
09/856,982 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
May 30, 2001
From: YANASE, YOSHIO; NAKAMURA, OSAMU; KOIKE, TAKASHI; KUDO, NOBORU
To: SUMITOMO METAL INDUSTRIES, LTD.
Reel/Frame 012092/0933 →
Assignment of Assignor's Interest
Jul 5, 2002
From: SUMITOMO METAL INDUSTRIES, LTD.
To: SUMITOMO MITSUBISHI SILICON CORPORATION
Reel/Frame 013060/0349 →