Patent Assignment
Reel/Frame 012229/0111
Corrective Assignment to Add a Second Assignee, Previously Recorded at Reel 011664 Frame 0426.
Recorded: 2001-10-05
Pages: 4
Assignors
NAKAO, MICHINOBU
Executed: 2001-02-22
HATAYAMA, KAZUMI
Executed: 2001-02-22
NATSUME, KOICHIRO
Executed: 2001-02-23
KIYASHIGE, YOSHIKAZU
Executed: 2001-02-22
KOUNO, MASAKI
Executed: 2001-02-28
HAMAMOTO, MASATO
Executed: 2001-03-01
YOSHIDA, HIDEFUMI
Executed: 2001-03-01
NAKAMURA, TOMOJI
Executed: 2001-03-01
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI INFORMATION TECHNOLGY CO., LTD.
456, SAKAI NAKAI-MACHI, ASHIGARAKAMI-GUN, KANAGAWA-KEN 231-0015, JAPAN
Covered Property
(1)
Test Method of Semiconductor Intergrated Circuit and Test Pattern Generator
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 20, 2001
From: NAKAO, MICHINOBU; HATAYAMA, KAZUMI; NATSUME, KOICHIRO; KIYOSHIGE, YOSHIKAZU
To: HITACHI, LTD.
Reel/Frame 011664/0426 →
Corrective Assignment to Correct the Name of the Assignor That Was Previously Recorded on Reel 012229, Frame 0111.
Apr 18, 2002
From: NAKAO, MICHINOBU; HATAYAMA, KAZUMI; NATSUME, KOICHIRO; KIYOSHIGE, YOSHIKAZU
To: HITACHI, LTD.; HITACHI INFORMATION TECHNOLOGY CO., LTD.
Reel/Frame 012807/0113 →
Merger
Nov 6, 2013
From: HITACHI INFORMATION TECHNOLOGY CO., LTD.
To: HITACHI INFORMATION & COMMUNICATION ENGINEERING, LTD.
Reel/Frame 031556/0020 →
Merger
Nov 7, 2013
From: HITACHI INFORMATION TECHNOLOGY CO., LTD.
To: HITACHI INFORMATION & TELECOMMUNICATION ENGINEERING, LTD.
Reel/Frame 031559/0159 →