IP Library › Assignment 012386/0171
Patent Assignment
Reel/Frame 012386/0171

Assignment of Assignor's Interest

Recorded: 2001-12-13 Pages: 3
Assignors
HSU, CHIN-JUNG
Executed: 2001-12-13
CHENG, ARNOLD
Executed: 2001-12-13
SONG, XIN
Executed: 2001-12-13
Assignee
INSPEX, INC.
47 MANNING ROAD, BILLERICA, MASSACHUSETTS, 01821
Covered Property (1)
Method and System for Reviewing a Semiconductor Wafer Using at Least One Defect Sampling Condition
Patent: 6,643,006 →
Application: 10/016,996 →
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 20, 2012
From: AUGUST TECHNOLOGY CORPORATION
To: RUDOLPH TECHNOLOGIES, INC.
Reel/Frame 029583/0982 →
Assignment of Assignor's Interest Mar 4, 2013
From: INSPEX, INC.
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 029915/0575 →
Assignment of Assignor's Interest Jul 2, 2020
From: RUDOLPH TECHNOLOGIES, INC.
To: ONTO INNOVATION INC.
Reel/Frame 053117/0623 →