IP Library › Assignment 029583/0982
Patent Assignment
Reel/Frame 029583/0982

Assignment of Assignor's Interest

Recorded: 2012-12-20 Pages: 16
Assignor
AUGUST TECHNOLOGY CORPORATION
Executed: 2012-12-19
Assignee
RUDOLPH TECHNOLOGIES, INC.
ONE RUDOLPH ROAD, FLANDERS, NEW JERSEY, 07836
Covered Properties (30)
System and Method for Selection of a Reference Die
Patent: 6,252,981 →
Application: 09/270,607 →
Automated Wafer Defect Inspection System and a Process of Performing Such Inspection
Patent: 6,324,298 →
Application: 09/352,564 →
System and Method for Locating Image Features
Patent: 6,744,913 →
Application: 09/551,106 →
Automated Wafer Defect Inspection System and a Process of Performing Such Inspection
Patent: 6,937,753 →
Application: 09/561,570 →
Automated Wafer Defect Inspection System and a Process of Performing Such Inspection
Patent: 6,826,298 →
Application: 09/562,273 →
System and Method for Locating Irregular Edges in Image Data
Patent: 6,459,807 →
Application: 09/592,641 →
System and Method for Inspecting Bumped Wafers
Patent: 6,765,666 →
Application: 09/631,509 →
Confocal 3D Inspection System and Process
Patent: 6,731,383 →
Application: 09/952,537 →
Publication: US 2002/0191178
Method and System for Reviewing a Semiconductor Wafer Using at Least One Defect Sampling Condition
Patent: 6,643,006 →
Application: 10/016,996 →
System and Method for Inspection Using Off-Angle Lighting
Patent: 7,024,031 →
Application: 10/035,592 →
Confocal 3D Inspection System and Process
Patent: 6,970,287 →
Application: 10/196,735 →
Confocal 3D Inspection System and Process
Patent: 6,773,935 →
Application: 10/196,741 →
Publication: US 2003/0027367
System and Method for Locating Irregular Edges in Image Data
Patent: 7,046,837 →
Application: 10/224,919 →
Publication: US 2002/0191832
Automated Wafer Defect Inspection System Using Backside Illumination
Patent: 7,629,993 →
Application: 10/262,173 →
Publication: US 2004/0061779
Method and System for Analyzing Bitmap Test Data
Patent: 6,842,866 →
Application: 10/281,398 →
Publication: US 2004/0083407
Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual lane
Patent: 7,111,095 →
Application: 10/423,475 →
Publication: US 2003/0221042
System and Method for Inspection Using White Light Intererometry
Patent: 7,158,235 →
Application: 10/467,438 →
Publication: US 2004/0090634
Optical Throughput Condenser
Patent: 7,192,173 →
Application: 10/622,847 →
Publication: US 2004/0057135
Inspection Tool with a 3D Point Sensor to Develop a Focus Map
Patent: 7,170,075 →
Application: 10/622,848 →
Publication: US 2004/0056173
System and Method for Inspecting a Component Using Interferometry
Patent: 7,019,841 →
Application: 10/742,254 →
Publication: US 2004/0227953
Fiber Optic Darkfield Ring Light
Patent: 7,220,034 →
Application: 10/888,302 →
Publication: US 2005/0007792
Edge Normal Process
Patent: 6,947,588 →
Application: 10/890,692 →
Publication: US 2005/0013474
Product Setup Sharing for Multiple Inspection Systems
Patent: 8,045,788 →
Application: 10/890,734 →
Publication: US 2005/0041850
Edge Inspection
Patent: 7,340,087 →
Application: 10/890,762 →
Publication: US 2005/0036671
Camera and Illumination Matching for Inspection System
Patent: 7,589,783 →
Application: 10/890,862 →
Publication: US 2005/0052530
Photoresist Edge Bead Removal Measurement
Patent: 7,197,178 →
Application: 10/890,933 →
Publication: US 2005/0013476
Adjustable Film Frame Aligner
Patent: 7,316,938 →
Application: 10/891,278 →
Publication: US 2005/0012229
System for Generating Camera Triggers
Patent: 7,813,638 →
Application: 11/146,301 →
Publication: US 2005/0276595
All Surface Data for Use in Substrate Inspection
Patent: 7,593,565 →
Application: 11/296,645 →
Publication: US 2006/0142971
Automated Wafer Defect Inspection System and a Process of Performing Such Inspection
Application: 13/273,645 →
Publication: US 2012/0087569
Related Assignments (25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 18, 2000
From: GUEST, CLYDE MAXWELL; THORNELL, JOHN MARK
To: SEMICONDUCTOR TECHNOLOGIES AND INSTRUMENTS
Reel/Frame 010755/0068 →
Assignment of Assignor's Interest May 16, 2000
From: O'DELL, JEFFREY; HARLESS, MARK; VERBURGT, THOMAS; HERRMANN, STEVE
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 010828/0929 →
Assignment of Assignor's Interest May 16, 2000
From: O'DELL, JEFFREY; HARLESS, MARK; VERBURGT, THOMAS
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 010828/0234 →
Assignment of Assignor's Interest May 16, 2000
From: O'DELL, JEFFERY; HARLESS, MARK; VERBURGT, THOMAS; WATKINS, CORY
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 010828/0259 →
Change of Name Jun 13, 2000
From: GUEST, CLYDE MAXWELL; CHANG, CHU-YIN
To: SEMICONDUCTOR TECHNOLOGIES AND INSTRUMENTS
Reel/Frame 010893/0795 →
Assignment of Assignor's Interest Aug 3, 2000
From: GUEST, CLYDE MAXWELL; ROY, RAJIV (NMI); HARRIS, CHARLES K.; WAHAWISAN, WEERAKIAT (NMI)
To: SEMICONDUCTOR TECHNOLOGIES AND INSTRUMENTS
Reel/Frame 011038/0551 →
Assignment of Assignor's Interest Feb 15, 2001
From: GUEST, CLYDE MAXWELL; ROY, RAJIV (NMI); HARRIS, CHARLES KENNETH
To: SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS, INC., A CORPORATION OF THE STATE OF DELAWARE
Reel/Frame 011522/0706 →
Assignment of Assignor's Interest Dec 13, 2001
From: HSU, CHIN-JUNG; CHENG, ARNOLD; SONG, XIN
To: INSPEX, INC.
Reel/Frame 012386/0171 →
Assignment of Assignor's Interest Jan 7, 2002
From: WATKINS, CORY
To: AUGUST TECHNOLOGY CORP.
Reel/Frame 012794/0158 →
Assignment of Assignor's Interest Mar 5, 2002
From: CASTELLANOS, RAMIRO NOLASCO; MATHUR, SANJEEV (NMI); THORNELL, JOHN MARK; CARRINGTON, THOMAS CASEY
To: SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS, INC.
Reel/Frame 012659/0131 →
Assignment of Assignor's Interest Aug 21, 2002
From: GUEST, CLYDE MAXWELL; CHANG, CHU-YIN
To: SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS, INC.
Reel/Frame 013220/0161 →
Assignment of Assignor's Interest Oct 21, 2002
From: WATKINS, CORY; VAUGHNN, DAVID; BLAIR, ALAN
To: AUGUST TECHNOLOGY CORP.
Reel/Frame 013411/0662 →
Assignment of Assignor's Interest Jan 28, 2003
From: SONG, XIN; HITELMAN, STEWART; HSU, CHIN-JUNG
To: INSPEX, INC.
Reel/Frame 013696/0991 →
Assignment of Assignor's Interest Mar 11, 2003
From: HARLESS, MARK; JENUM, JEREMY; CAYMOND, WILLARD
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 013832/0727 →
Assignment of Assignor's Interest Aug 1, 2003
From: WATKINS, CORY M.; HARLESS, MARK R.
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 014345/0835 →
Assignment of Assignor's Interest Aug 5, 2003
From: MATHUR, SANJEEV; CHANG, CHU-YIN
To: SEMICONDUCTORS TECHNOLOGIES & INSTRUMENTS
Reel/Frame 014812/0870 →
Assignment of Assignor's Interest Oct 31, 2003
From: VAUGHNN, DAVID
To: AUGUST TECHNOLOGY CORP.
Reel/Frame 014649/0954 →
Assignment of Assignor's Interest Nov 3, 2003
From: OBERSKI, NORMAN L.; HARLESS, MARK R.
To: AUGUST TECHNOLOGY CORP.
Reel/Frame 014654/0769 →
Assignment of Assignor's Interest Apr 19, 2004
From: HARLESS, MARK; JENUM, JEREMY; RAYMOND, WILLARD
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 015220/0725 →
Assignment of Assignor's Interest Jul 9, 2004
From: MATHUR, SANJEEV
To: AUGUST TECHNOLOGY CORP.
Reel/Frame 015555/0526 →
Merger May 4, 2011
From: AUGUST TECHNOLOGY CORPORATION
To: RUDOLPH TECHNOLOGIES INC.
Reel/Frame 026222/0062 →
Assignment of Assignor's Interest May 4, 2011
From: AUGUST TECHNOLOGY CORPORATION
To: RUDOLPH TECHNOLOGIES, INC.
Reel/Frame 026221/0896 →
Assignment of Assignor's Interest Dec 6, 2012
From: WATKINS, CORY; VAUGHNN, DAVID
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 029420/0619 →
Assignment of Assignor's Interest Dec 7, 2012
From: INSPEX INC.
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 029427/0725 →
Assignment of Assignor's Interest Dec 11, 2012
From: SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS
To: AUGUST TECHNOLOGY CORPORATION
Reel/Frame 029446/0006 →