Patent Assignment
Reel/Frame 012413/0927
Assignment of Assignor's Interest
Recorded: 2001-12-27
Pages: 3
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Test Circuit for Logical Integrated Circuit and Method for Testing Same
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.