IP Library Assignment 013787/0294
Patent Assignment
Reel/Frame 013787/0294

Assignment of Assignor's Interest

Recorded: 2003-02-25 Pages: 9
Assignor
NEC CORPORATION
Executed: 2002-11-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE NAKAHARA-KU, KAWASAKI KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Test Circuit for Logical Integrated Circuit and Method for Testing Same
Patent: 7,069,486 →
Application: 10/026,532 →
Publication: US 2002/0087929
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 27, 2001
From: NAGAMINE, RYOUICHIROU; MAKITA, YASUTERU
To: NEC CORPORATION
Reel/Frame 012413/0927 →
Change of Name Dec 13, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025486/0592 →