Patent Assignment
Reel/Frame 012556/0943
Assignment of Assignor's Interest
Recorded: 2002-02-04
Pages: 3
Assignor
FUJITA, SHIN
Executed: 2002-01-18
Assignee
SEIKO EPSON CORPORATION
4-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU, TOKYO, JAPAN
Covered Property
(1)
Test Method of Electro-Optical Device, Test Circuit of Electro-Optical Device, Electro-Optical Device, and Electronic Equipment
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 11, 2016
From: SEIKO EPSON CORPORATION
To: INTELLECTUALS HIGH-TECH KFT
Reel/Frame 039300/0295 →
Assignment of Assignor's Interest
Jul 11, 2016
From: INTELLECTUALS HIGH-TECH KFT
To: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
Reel/Frame 039301/0043 →