IP Library Assignment 013100/0747
Patent Assignment
Reel/Frame 013100/0747

Assignment of Assignor's Interest

Recorded: 2002-07-19 Pages: 3
Assignor
KASHIWAGI, SHINJI
Executed: 2002-04-08
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Scan Test Circuit Including a Control Test Mode
Patent: 7,222,276 →
Application: 10/127,959 →
Publication: US 2002/0162065
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 19, 2003
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 013760/0821 →
Change of Name Dec 13, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025486/0530 →