Scan test circuit including a control test mode
View Patent ↗A scan test circuit ( 100 ) including a path for capturing a control signal during a test mode is disclosed. Scan test circuit ( 100 ) may include a control supply circuit ( 20 ), a clock control circuit ( 30 ), a control signal test circuit ( 40 ), and a scan flip-flop ( 1 ). Control supply circuit ( 20 ) may receive a control signal (Enable signal), which may be used for enabling a clock signal (CLK) in a gated clock system. A control supply test circuit ( 40 ) may provide a signal path that can apply control signal (Enable signal) to scan flip-flop ( 1 ) for capturing. In this way, functionality of a combination circuit used for generating a control signal (Enable signal) may be verified.
1. A scan test circuit, comprising:
a control signal test circuit coupled to receive a control signal having a control signal logic level and to provide a control test circuit output based on the control signal logic level to a scan flip-flop to verify the control signal during a control test mode of operation; and
a clock control circuit coupled to receive the control signal and provide a clock signal to the scan flip-flop when the control signal has an enable logic level.
2. The scan test circuit according to claim 1 , wherein:
the control signal test circuit is coupled to receive a data signal having a data signal logic level and provides the control test circuit output based on the data signal logic level during a normal mode of operation.
3. The scan test circuit according to claim 1 , wherein:
during the control test mode of operation, the control signal test circuit is coupled to provide the control test circuit output based on a logic combination of the control signal logic level and the data signal logic level.
4. The scan test circuit according to claim 3 , wherein:
the logic combination is selected from the group comprising an exclusive OR or an exclusive NOR.
5. The scan test circuit according to claim 1 , wherein:
the clock control circuit is coupled to receive a test mode signal having a test mode logic level during the control test mode of operation and provide the clock signal to the scan flip-flop when the test mode signal has the test mode logic level.
6. The scan test circuit according to claim 1 , wherein:
the scan flip-flop is coupled to receive a scan data signal, a data signal, a scan enable signal, and a clock signal and provides a scan flip-flop output in synchronism with the clock signal, and the scan flip-flop output is based on the scan data signal when the scan enable signal has a first scan enable logic level and is based on the data signal when the scan enable signal has a second scan enable logic level.
7. A scan test circuit, comprising:
a scan flip-flop coupled to receive scan data in a scan chain at a scan data input terminal and a control signal test circuit output at a data input terminal;
a clock control circuit coupled to receive a control signal and provide a clock signal to a clock input terminal of the scan flip-flop; and
a control signal test circuit coupled to receive the control signal and a first data from a combination circuit and provide the control signal test circuit output to verify the control signal during a control test mode of operation.
8. The scan test circuit according to claim 7 , further including:
a control supply circuit coupled to receive the control signal and provide a control supply circuit output to the clock control circuit.
9. The scan test circuit according to claim 8 , wherein:
the control signal test circuit is coupled to receive the control supply circuit output.
10. The scan test circuit according to claim 7 , wherein:
the scan flip-flop is coupled to receive a scan enable signal and latch the scan data in synchronism with the clock signal when the scan enable signal has a first logic level and latch the control signal test circuit output in synchronism with the clock signal when the scan enable signal has a second logic level.
11. The scan test circuit according to claim 7 , wherein:
the control signal test circuit is coupled to receive a control capture signal having a first control capture logic level and a second control capture logic level, and provide the control signal test circuit output having a control signal test logic level based on the first data when the control capture signal has the first control capture logic level and the control signal test logic level based on the control signal when the control capture signal has the second logic level.
12. The scan test circuit according to claim 7 , wherein:
the control signal is provided from the combination circuit.
13. The scan test circuit according to claim 7 , wherein:
the clock control circuit is coupled to receive a scan test enable signal.
14. A scan test circuit, comprising:
a scan flip-flop coupled to receive scan data in a scan chain at a scan data input terminal and a control signal test circuit output at a data input terminal;
a control supply circuit coupled to receive a control signal from a combination circuit and provide a control supply output;
a clock control circuit coupled to receive the control supply output and provide a clock signal to a clock input terminal of the scan flip-flop; and
a control signal test circuit coupled to receive the control signal and the first data from the combination circuit and provide the control signal test circuit output to verify the control signal during a control test mode of operation.
15. The scan test circuit according to claim 14 , wherein:
the clock control circuit includes a first logic gate coupled to receive the control supply output and a first clock signal and provide the clock signal to the clock input terminal when the control supply output has a clock enable logic level.
16. The scan test circuit according to claim 15 , wherein:
the first logic gate is coupled to receive a scan test enable signal and provides the clock signal to the clock input terminal when the scan test enable signal has a scan test enable logic level.
17. The scan test circuit according to claim 16 , wherein:
the clock control circuit is disabled when the scan test enable signal has a scan test disable logic level and the control supply output has a clock disable logic level.
18. The scan test circuit according to claim 14 , wherein:
the control signal test circuit is coupled to receive the control signal through the control supply circuit and provides the control signal test circuit output based on an exclusive logic function of the control signal and the first data when a scan test signal has a scan test enable logic level.
19. The scan test circuit according to claim 14 , wherein:
the control signal test circuit is coupled to receive a control capture signal having a first control capture logic level and a second control capture logic level, and provide the control signal test circuit output having a control signal test logic level based on the first data when the control capture signal has the first control capture logic level and the control signal test logic level based on the control signal when the control capture signal has the second logic level.
20. A scan circuit, comprising:
a flip-flop having a data terminal and a clock terminal;
a clock gating circuit receiving a clock signal, a clock enable signal and providing said clock signal to said clock terminal of said flip-flop, said clock gating circuit being provided to gate said clock signal according to a logic level of said clock enable signal; and
a signal path allowing said clock enable signal to be captured by said flip-flop through said data terminal.
21. The scan circuit according to claim 20 , wherein:
said clock gating circuit receives a gate enable signal, and gates said clock signal according to a logic level of said clock enable signal when said gate enable signal has enable logic level, and provides said clock signal to said clock terminal of said flip-flop independent of logic level of said clock enable signal when said gate enable signal has disable level.
22. The scan circuit according to claim 21 , wherein:
said flip-flop has a scan terminal receiving a scan data and a scan enable terminal receiving a scan enable signal; and
said flip-flop captures said scan data from said scan terminal when said scan enable signal has an enable logic level, and captures a data from said data terminal when said scan enable signal has a disable logic level.
23. The scan circuit according to claim 22 , wherein said gate enable signal and said scan enable signal are independent of each other.
24. The scan circuit according to claim 21 , wherein:
said signal path having
a mask circuit receiving a mask enable signal and said clock enable signal and masking said clock enable signal according to a logic level of said mask signal.
25. The scan circuit according to claim 24 , wherein said mask enable signal is said gate enable signal.
26. The scan circuit according to claim 24 , wherein said mask enable signal and said gate enable signal are independent of each other.