Patent Assignment
Reel/Frame 013379/0136
Corrective Assignment to Correct Both Assignees Address Previously Recorded at Reel 012790 Frame 0445.
Recorded: 2002-10-11
Pages: 3
Assignors
HAMAMATSU, AKIRA
Executed: 2002-01-11
NOGUCHI, MINORI
Executed: 2002-01-15
OOSHIMA, YOSHIMASA
Executed: 2002-01-15
NISHIYAMA, HIDETOSHI
Executed: 2002-01-11
WATANABE, TETSUYA
Executed: 2002-01-11
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI ELECTRONICS ENGINEERING CO., LTD.
F-NISSEI EBISU BLDG., 16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property
(1)
.Apparatus and Method for Inspecting Defects
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 12, 2002
From: HAMAMATSU, AKIRA; NOGUCHI, MINORI; OOSHIMA, YOSHIMASA; NISHIYAMA, HIDETOSHI
To: HITACHI, LTD.; HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 012790/0445 →
Change of Name
Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0118 →