Patent Assignment
Reel/Frame 015642/0021
Change of Name
Recorded: 2004-07-27
Pages: 3
Assignor
HITACHI ELECTRONICS ENGINEERING CO., LTD.
Executed: 2004-04-01
Assignee
HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Properties
(16)
Inspecting Method and Apparatus for Repeated Micro-Miniature Patterns
Patent:
6,661,912 →
Application:
09/127,960 →
Apparatus and Method for Testing Defects
Patent:
6,411,377 →
Application:
09/362,135 →
Method of manufacturing semiconductor device
Patent:
6,365,425 →
Application:
09/604,251 →
Apparatus Method of Inspecting Foreign Particle or Defect on a Sample
Patent:
6,597,448 →
Application:
09/644,069 →
Method of Inspecting a Semiconductor Device and an Apparatus Thereof
Surface Inspection Apparatus and Method Thereof
Apparatus for Detecting Foreign Particle and Defect and the Same Method
.Apparatus and Method for Inspecting Defects
Apparatus and Method for Testing Defects
Apparatus and Method for Measuring Alignment Accuracy, as Well as Method and System for Manufacturing Semiconductor Device
Resin Application Method on Panel, and Manufacturing Method of Panel for Display
System for Monitoring Foreign Particles, Process Processing Apparatus and Method of Electronic Commerce
Inspecting Method and Apparatus for Repeated Micro-Miniature Patterns
Inspection Method and Inspection Apparatus
Method for Inspecting Defect and Apparatus for Inspecting Defect
A Testing Apparatus for Conducting a Test on a Magnetic Recording Medium or a Magnetic Head Through Recording Test Data on the Magnetic Recording Medium and Reproducing Recorded Test Data Therefrom by Means of the Magnetic Head
Related Assignments
(12)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 28, 2001
From: OSHIMA, YOSHIMASA; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; MITOMO, KENJI
To: HITACHI, LTD.; HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 012403/0268 →
Assignment of Assignor's Interest
Jul 31, 2003
From: NISHIYAMA, HIDETOSHI; NOGUCHI, MINORI; WATANABE, TETSUYA; SEKIGUCHI, TAKUAKI
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014348/0696 →
Assignment of Assignor's Interest
Aug 5, 2003
From: TAGUCHI, JUNICHI; SUGIMOTO, ARITOSHI; IKOTA, MASAMI; INOUE, YUKO
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014353/0139 →
Corrective Assignment to Correct the First Assignor's Last Name, Previously Recorded at Reel 013620 Frame 0275.
Sep 2, 2003
From: NOGUCHI, MINORI; NAKADA, MASAHIKO; SUZUKI, TAKAHIKO; UENO, TAKETO
To: HITACHI, LTD.; HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014452/0692 →
Assignment of Assignor's Interest
Oct 20, 2003
From: WADA, KENYA; ONOSHIRO, JUN; HIRASEKO, KOUJI
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014628/0463 →
Assignment of Assignor's Interest
Nov 28, 2003
From: HAMAMATSU, AKIRA; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; OHSHIMA, YOSHIMASA
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014748/0046 →
Assignment of Assignor's Interest
May 3, 2004
From: HAMAMATSU, AKIRA; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; OHSHIMA, YOSHIMASA
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015292/0916 →
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0110 →
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0118 →
Merger
Jul 26, 2006
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 018131/0001 →
Assignment of Assignor's Interest
Mar 25, 2011
From: HITACHI, LTD.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 026109/0976 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →