IP Library Assignment 014353/0139
Patent Assignment
Reel/Frame 014353/0139

Assignment of Assignor's Interest

Recorded: 2003-08-05 Pages: 3
Assignors
TAGUCHI, JUNICHI
Executed: 1998-07-31
SUGIMOTO, ARITOSHI
Executed: 1998-07-31
IKOTA, MASAMI
Executed: 1998-07-31
INOUE, YUKO
Executed: 1998-07-31
WATANABE, TETSUYA
Executed: 1998-07-31
SHINKE, WAKANA
Executed: 1998-07-31
Assignee
HITACHI ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO 150-0011, JAPAN
Covered Property (1)
Inspecting Method and Apparatus for Repeated Micro-Miniature Patterns
Patent: 6,661,912 →
Application: 09/127,960 →
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →
Assignment of Assignor's Interest Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0110 →