Patent Assignment
Reel/Frame 016547/0110
Assignment of Assignor's Interest
Recorded: 2005-07-21
Pages: 3
Assignor
HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Executed: 2005-03-20
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Properties
(6)
Inspecting Method and Apparatus for Repeated Micro-Miniature Patterns
Patent:
6,661,912 →
Application:
09/127,960 →
Apparatus and Method for Testing Defects
System for Monitoring Foreign Particles, Process Processing Apparatus and Method of Electronic Commerce
Inspecting Method and Apparatus for Repeated Micro-Miniature Patterns
Inspection Method and Inspection Apparatus
Method for Inspecting Defect and Apparatus for Inspecting Defect
Related Assignments
(5)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 31, 2003
From: NISHIYAMA, HIDETOSHI; NOGUCHI, MINORI; WATANABE, TETSUYA; SEKIGUCHI, TAKUAKI
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014348/0696 →
Assignment of Assignor's Interest
Aug 5, 2003
From: TAGUCHI, JUNICHI; SUGIMOTO, ARITOSHI; IKOTA, MASAMI; INOUE, YUKO
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014353/0139 →
Assignment of Assignor's Interest
Nov 28, 2003
From: HAMAMATSU, AKIRA; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; OHSHIMA, YOSHIMASA
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 014748/0046 →
Assignment of Assignor's Interest
May 3, 2004
From: HAMAMATSU, AKIRA; NOGUCHI, MINORI; NISHIYAMA, HIDETOSHI; OHSHIMA, YOSHIMASA
To: HITACHI ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015292/0916 →
Change of Name
Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →