IP Library › Assignment 014748/0046
Patent Assignment
Reel/Frame 014748/0046

Assignment of Assignor's Interest

Recorded: 2003-11-28 Pages: 2
Assignors
HAMAMATSU, AKIRA
Executed: 2003-10-30
NOGUCHI, MINORI
Executed: 2003-10-30
NISHIYAMA, HIDETOSHI
Executed: 2003-10-30
OHSHIMA, YOSHIMASA
Executed: 2003-10-28
JINGU, TAKAHIRO
Executed: 2003-10-28
UTO, SACHIO
Executed: 2003-10-30
Assignee
HITACHI ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property (1)
Inspection Method and Inspection Apparatus
Patent: 7,315,363 →
Application: 10/722,531 →
Publication: US 2004/0105093
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →
Assignment of Assignor's Interest Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0110 →