Patent Assignment
Reel/Frame 015292/0916
Assignment of Assignor's Interest
Recorded: 2004-05-03
Pages: 2
Assignors
HAMAMATSU, AKIRA
Executed: 2004-02-12
NOGUCHI, MINORI
Executed: 2004-02-16
NISHIYAMA, HIDETOSHI
Executed: 2004-02-13
OHSHIMA, YOSHIMASA
Executed: 2004-02-12
JINGU, TAKAHIRO
Executed: 2004-02-12
UTO, SACHIO
Executed: 2004-02-13
Assignee
HITACHI ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property
(1)
Method for Inspecting Defect and Apparatus for Inspecting Defect
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0110 →