IP Library Assignment 014452/0692
Patent Assignment
Reel/Frame 014452/0692

Corrective Assignment to Correct the First Assignor's Last Name, Previously Recorded at Reel 013620 Frame 0275.

Recorded: 2003-09-02 Pages: 3
Assignors
NOGUCHI, MINORI
Executed: 2002-09-12
NAKADA, MASAHIKO
Executed: 2002-10-12
SUZUKI, TAKAHIKO
Executed: 2002-10-12
UENO, TAKETO
Executed: 2002-12-12
NAKATA, TOSHIHIKO
Executed: 2002-12-12
MAEDA, SHUNJI
Executed: 2002-12-12
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI ELECTRONICS ENGINEERING CO., LTD.
16-3, HIGASHI 3-CHOME, SHIBUYA-KU, TOKYO, JAPAN
Covered Property (1)
Apparatus and Method for Measuring Alignment Accuracy, as Well as Method and System for Manufacturing Semiconductor Device
Patent: 6,897,956 →
Application: 10/235,656 →
Publication: US 2003/0160960
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →
Assignment of Assignor's Interest Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0118 →