Patent Assignment
Reel/Frame 012403/0268
Assignment of Assignor's Interest
Recorded: 2001-12-28
Pages: 2
Assignors
OSHIMA, YOSHIMASA
Executed: 2001-12-10
NOGUCHI, MINORI
Executed: 2001-12-12
NISHIYAMA, HIDETOSHI
Executed: 2001-12-13
MITOMO, KENJI
Executed: 2001-12-17
OKAWA, TAKASHI
Executed: 2001-12-17
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
HITACHI ELECTRONICS ENGINEERING CO., LTD.
F-NISSEI EBISU BLDG, 16-3, HIGASHI, 3-CHOME SHIBUYA-KU, TOKYO, JAPAN
Covered Property
(1)
Apparatus for Detecting Foreign Particle and Defect and the Same Method
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Jul 27, 2004
From: HITACHI ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Reel/Frame 015642/0021 →
Assignment of Assignor's Interest
Jul 21, 2005
From: HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 016547/0118 →