Patent Assignment
Reel/Frame 013410/0542
Assignment of Assignor's Interest
Recorded: 2002-10-21
Pages: 3
Assignor
BYRNE, MICHAEL
Executed: 2002-09-30
Assignee
LEICA MICROSYSTEMS INC.
3362 WALDEN AVENUE, DEPEW, NEW YORK, 14043
Covered Property
(1)
Method and Apparatus for Measuring the Refractive Index of at Least Two Samples
Application:
10/274,588 →
Publication:
US 2004/0075827
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.