Assignment of Assignor's Interest

Recorded: 2003-03-17 Pages: 2

Assignor

LEICA MICROSYSTEMS INC.

Executed: 2003-01-28

Assignee

REICHERT, INC.

3374 WALDEN AVENUE, DEPEW, NEW YORK, 14043

Covered Property (1)

Method and Apparatus for Measuring the Refractive Index of at Least Two Samples

Application: 10/274,588 →

Publication: US 2004/0075827

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.