Patent Assignment
Reel/Frame 013725/0777
Assignment of Assignor's Interest
Recorded: 2003-01-30
Pages: 4
Assignors
SAKAI, KENICHI
Executed: 2003-01-10
KOSEKO, YASUSHI
Executed: 2003-01-10
MORITA, YASUMASA
Executed: 2003-01-10
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JAPAN
MITSUBISHI ELECTRIC ENGINEERING COMPANY LIMITED
2-6-2, OHTEMACHI, CHIYODA-KU, TOKYO 100-0004, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Device Having Operation Test Function
Related Assignments
(6)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Change of Name
Sep 15, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024990/0059 →
Merger
Sep 15, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024990/0098 →
Assignment of Assignor's Interest
Aug 24, 2017
From: MITSUBISHI ELECTRIC ENGINEERING CO., LTD.
To: RENESAS SYSTEM DESIGN CO., LTD.
Reel/Frame 043668/0291 →
Merger
Nov 28, 2017
From: RENESAS SYSTEM DESIGN CO., LTD.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044921/0873 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →