IP Library › Assignment 013830/0577
Patent Assignment
Reel/Frame 013830/0577

Assignment of Assignor's Interest

Recorded: 2003-07-25 Pages: 3
Assignors
MA, XIANYUN
Executed: 2003-07-01
SUDARSHAN, TANGALI S.
Executed: 2003-07-01
Assignee
UNIVERSITY OF SOUTH CAROLINA, THE
OSBURN 206, COLUMBIA, SOUTH CAROLINA, 28208
Covered Property (1)
System and Method for Detecting Defects in Semiconductor Wafers
Patent: 7,220,978 →
Application: 10/413,657 →
Publication: US 2004/0206891
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Confirmatory License Sep 20, 2011
From: SOUTH CAROLINA, UNIVERSITY OF
To: NAVY, SECRETARY OF THE UNITED STATES OF AMERICA
Reel/Frame 027060/0313 →