Patent Assignment
Reel/Frame 027060/0313
Confirmatory License
Recorded: 2011-09-20
Pages: 2
Assignor
SOUTH CAROLINA, UNIVERSITY OF
Executed: 2010-11-10
Assignee
NAVY, SECRETARY OF THE UNITED STATES OF AMERICA
875 NORTH RANDOLPH STREET, OFFICE OF NAVAL RESEARCH, ARLINGTON, VIRGINIA, 22203-1995
Covered Property
(1)
System and Method for Detecting Defects in Semiconductor Wafers
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.