IP Library › Assignment 013841/0561
Patent Assignment
Reel/Frame 013841/0561

Assignment of Assignor's Interest

Recorded: 2003-03-04 Pages: 3
Assignors
HANJI, HIKOSHI
Executed: 2003-02-06
MATSUI, YASUHIRO
Executed: 2003-02-06
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property (1)
Semiconductor Memory Device with Test Mode and Testing Method Thereof
Patent: 6,873,556 →
Application: 10/377,596 →
Publication: US 2004/0081008
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →
Change of Name Sep 10, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0001 →