IP Library › Assignment 013871/0207
Patent Assignment
Reel/Frame 013871/0207

Assignment of Assignor's Interest

Recorded: 2003-03-07 Pages: 3
Assignors
YAMAZAKI, AKIRA
Executed: 2003-02-12
MANGYO, ATSUO
Executed: 2003-02-12
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3 MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property (1)
Semiconductor Circuit Device Capable of Accurately Testing Embedded Memory
Patent: 6,807,116 →
Application: 10/383,289 →
Publication: US 2004/0013016
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →
Change of Name Sep 8, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024953/0237 →