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App. No. 10/383,289 · Confirmation No. 2646

SEMICONDUCTOR CIRCUIT DEVICE CAPABLE OF ACCURATELY TESTING EMBEDDED MEMORY

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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2004-09-01 IFEE Issue Fee Payment (PTO-85B) 1 View
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2004-07-14 892 List of references cited by examiner 1 View
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2004-07-14 FWCLM Index of Claims 1 View
2004-07-14 SRFW Search information including classification, databases and other search related notes 1 View
2003-03-07 TRNA Transmittal of New Application 2 View
2003-03-07 ADS Application Data Sheet 4 View
2003-03-07 A.PE Preliminary Amendment 14 View
2003-03-07 SPEC Specification 35 View
2003-03-07 CLM Claims 4 View
2003-03-07 ABST Abstract 1 View
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2003-03-07 FRPR Certified Copy of Foreign Priority Application 68 View
2003-03-07 FOR Foreign Reference 20 View
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Quick Facts
App. No.
10/383,289
Filed
2003-03-07
Granted
2004-10-19
Pub. No.
US20040013016A1
Examiner
LUU, PHO M
Art Unit
2824
PTA
0 days