IP Library › Assignment 013871/0652
Patent Assignment
Reel/Frame 013871/0652

Assignment of Assignor's Interest

Recorded: 2003-03-10 Pages: 4
Assignor
MAENO, HIDESHI
Executed: 2003-02-13
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3 MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit Device Having a Test Circuit of a Random Access Memory
Patent: 6,964,000 →
Application: 10/383,553 →
Publication: US 2004/0059976
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 10, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015451/0886 →
Change of Name Sep 15, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024990/0129 →
Merger Sep 15, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024990/0153 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →