IP Library › Assignment 013912/0130
Patent Assignment
Reel/Frame 013912/0130

Assignment of Assignor's Interest

Recorded: 2003-03-27 Pages: 3
Assignors
MORISHITA, FUKASHI
Executed: 2003-03-13
KINOSHITA, MITSUYA
Executed: 2003-03-13
Assignee
KAISHA, MITSUBISHI DENKI KABUSHIKI
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU TOKYO, 100-8310, JAPAN
Covered Property (1)
Semiconductor Memory Device with Circuit Executing Burn-in Testing
Patent: 6,704,231 →
Application: 10/397,211 →
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →
Change of Name Sep 10, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0001 →