IP Library › Assignment 014120/0709
Patent Assignment
Reel/Frame 014120/0709

Assignment of Assignor's Interest

Recorded: 2003-06-04 Pages: 3
Assignors
ISOZAKI, HISASHI
Executed: 2003-03-04
YAMAZAKI, MICHIHIRO
Executed: 2003-03-04
YOSHIKAWA, HIROSHI
Executed: 2003-03-04
MIKI, NAOTO
Executed: 2003-03-04
MAEKAWA, HIROYUKI
Executed: 2003-03-04
TAKAHASHI, NAOHIRO
Executed: 2003-03-04
Assignees
TOPCON, KABUSHIKI KAISHA
75-1 HASUNUMA-CHO, ITABASHI-KU, TOKYO-TO, JAPAN
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, JAPAN
Covered Property (1)
Surface Inspection Method and Surface Inspection System
Patent: 7,064,820 →
Application: 10/393,833 →
Publication: US 2003/0184744
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 13, 2009
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 022248/0521 →
Change of Name Dec 5, 2011
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027327/0143 →